主管:中国科学院
主办:中国优选法统筹法与经济数学研究会
   中国科学院科技战略咨询研究院

Chinese Journal of Management Science ›› 2013, Vol. 21 ›› Issue (6): 1-10.

• Articles •     Next Articles

Study on Dynamic VaR Measures Based on SV-SGED Model

WU Xin-yu1, MA Zong-gang2, WANG Shou-yang3, MA Chao-qun2   

  1. 1. School of Finance, Anhui University of Finance & Economics, Bengbu 233030, China;
    2. School of Business Administration, Hunan University, Changsha 410082, China;
    3. Academy of Mathematics and Systems Science, Chinese Academy of Sciences, Beijing 100190, China
  • Received:2011-10-19 Revised:2012-08-22 Online:2013-12-29 Published:2013-12-23

Abstract: In this paper, skewed generalized error distribution (SGED) is introduced to account for skewed and heavy-tailed financial asset returns, and SV-SGED model is proposed to model asset return volatility, and then dynamic value-at-risk (VaR) can be measured. In order to test the accuracy of risk models, the back-testing technique is adopted. At the same time, a method for maximum likelihood (ML) estimation of SV models is introduced based on the efficient importance sampling (EIS) technique. Finally, an empirical study of Shanghai Stock Exchange composite index is presented. Empirical results demonstrate that the SV-SGED model can describe asset return volatility better than the SV model based on normal distribution (SV-N) and the SV model based on generalized error distribution (SV-GED), and the SV-SGED model can yield more accurate VaR estimates than the SV-N and SV-GED models.

Key words: VaR, SV models, skewed generalized error distribution, efficient importance sampling, maximum likelihood estimation

CLC Number: